The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2008
Filed:
Feb. 13, 2007
Applicant:
Koji Kohara, Yokohama, JP;
Inventor:
Koji Kohara, Yokohama, JP;
Assignee:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention provides a semiconductor integrated circuit that is provided with an address generation circuit that selectively generates an address of a memory cell substituted by a redundancy memory cell based on a defective memory cell address retained in an address retention circuit, and a control circuit that selectively tests the redundancy memory cell by performing a retest on whether the substitution is successful or not based on the address generated by the address generation circuit.
Kohara, Koji. (2008). Semiconductor integrated circuit and testing method therefor (U.S. Patent No. 7414905). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7414905
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile