The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2008

Filed:

Mar. 29, 2006
Applicant:

Lawrence D. Barker, Enumclaw, WA (US);

Inventor:

Lawrence D. Barker, Enumclaw, WA (US);

Assignee:

EB Associates, Enumclaw, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

The method for calibration of a single point laser system used in a measuring system for wood boards in a sawmill includes the steps of storing two orthogonal dimensions of a calibration bar, the values of the two dimensions being different from each other; placing the calibration bar within the scan zone of the measuring system, which is between two opposing lasers; measuring the distance to the calibration bar from each laser in a first dimension, and rotating the bar to its orthogonal dimension and again measuring the distance to the bar from each of the lasers. The distance information to the calibration bar and the known dimensional values of the bar in the two dimensions are then used to determine that a calibration bar is present rather than a wood board to be measured. If the presence of a calibration bar is confirmed, then the distance values and the dimension values are used to determine the actual distance between the two lasers. This information is then compared with the last known laser distance to provide calibration information for the system.


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