The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2008
Filed:
May. 16, 2001
Armin Maidhof, Kolbermoor, DE;
Peter Andrā, Neubeuern, DE;
Manfred Adlhart, Kosen, AT;
Michael Kaus, Bensheim/Auerbach, DE;
Markus Basel, Bischofsheim, DE;
Frank Thoss, Neubeuern, DE;
Markus Lazar, Nussdorf, DE;
Thomas Nasswetter, Raubling, DE;
Hans Steinbichler, Neubeuern, DE;
Armin Maidhof, Kolbermoor, DE;
Peter Andrā, Neubeuern, DE;
Manfred Adlhart, Kosen, AT;
Michael Kaus, Bensheim/Auerbach, DE;
Markus Basel, Bischofsheim, DE;
Frank Thoss, Neubeuern, DE;
Markus Lazar, Nussdorf, DE;
Thomas Nasswetter, Raubling, DE;
Hans Steinbichler, Neubeuern, DE;
Steinbichler Optotechnik GmbH, Neubeuern, DE;
Abstract
The invention relates to a method for determining the 3D profile of an object. In order to improve a method of this type, several sections of the object () are measured. During at least one measuring operation, at least one reference object () is measured. The measured sections of the object () are combined ().