The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7414708 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 19, 2008

Filed:

Aug. 01, 2006
Applicants:

Daniel Bivolaru, Hampton, VA (US);

Paul M. Danehy, Newport News, VA (US);

Joseph W. Lee, Williamsburg, VA (US);

Inventors:

Daniel Bivolaru, Hampton, VA (US);

Paul M. Danehy, Newport News, VA (US);

Joseph W. Lee, Williamsburg, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01P 3/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for performing simultaneous multi-point measurements of multiple velocity components in a gas flow is described. Pulses of laser light are directed to a measurement region of unseeded gas to produce Rayleigh or Mie scattered light in a plurality of directions. The Rayleigh or Mie scattered light is collected from multiple directions and combined in a single collimated light beam. The Rayleigh or Mie scattered light is then mixed together with a reference laser light before it is passed through a single planar Fabry-Perot interferometer for spectral analysis. At the output of the interferometer, a high-sensitivity CCD camera images the interference fringe pattern. This pattern contains the spectral and spatial information from both the Rayleigh scattered light and the reference laser light. Interferogram processing software extracts and analyzes spectral profiles to determine the velocity components of the gas flow at multiple points in the measurement region. The Rayleigh light rejected by the interferometer is recirculated to increase the accuracy and the applicability of the method for measurements at high temperatures without requiring an increase in the laser energy.


Find Patent Forward Citations

Bivolaru, Daniel. (2008). Interferometric rayleigh scattering measurement system (U.S. Patent No. 7414708). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7414708

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