The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2008
Filed:
Jul. 15, 2003
Masahito Watanabe, Hachioji, JP;
Shinichi Mihara, Tama, JP;
Azusa Noguchi, Hino, JP;
Toru Miyajima, Akishima, JP;
Yuji Miyauchi, Machida, JP;
Masahito Watanabe, Hachioji, JP;
Shinichi Mihara, Tama, JP;
Azusa Noguchi, Hino, JP;
Toru Miyajima, Akishima, JP;
Yuji Miyauchi, Machida, JP;
Olympus Corporation, Tokyo, JP;
Abstract
The invention relates to an imaging system in which, while high image quality is maintained with the influence of diffraction minimized, the quantity of light is controlled, and which enables the length of the zoom lens to be cut down. The imaging system comprises a zoom lens comprising a plurality of lens groups Gand Gwherein the spacing between individual lens groups is varied to vary a focal length and an aperture stop located in an optical path for limiting at least an axial light beam diameter, and an electronic image pickup device I located on the image side of the zoom lens. The aperture stop has a fixed shape, and a filter Sfor performing light quantity control by varying transmittance is located on an optical axis of a space located at a position different from that of a space in which the aperture stop is located.