The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2008

Filed:

Jun. 23, 2006
Applicant:

André Lalonde, Allen, TX (US);

Inventor:

André Lalonde, Allen, TX (US);

Assignee:

Finisar Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods for testing optical components, such as laser diodes or light emitting diodes, that are manufactured for use in optical transmitters or transceivers. The testing methods are performed using a true RMS conversion circuit in a test apparatus. The testing methods are performed by receiving an optical signal with AC and DC components from the optical component that is to be tested. The optical signal is converted to an electrical signal, and the AC and DC components of the electrical signal are separated. An RMS circuit of the test apparatus converts the AC component of the electrical signal to a DC function of the RMS value of the AC component of the electrical signal. This testing method can be used to determine whether optical components are suitable for use by customers or in products.


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