The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7413920 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 19, 2008

Filed:

Sep. 28, 2006
Applicants:

Young-chul Ko, Yongin-si, KR;

Hyun-ku Jeong, Yongin-si, KR;

Inventors:

Young-chul Ko, Yongin-si, KR;

Hyun-ku Jeong, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A double-sided etching method using an embedded alignment mark includes: preparing a substrate having first and second alignment marks embedded in an intermediate portion thereof; etching an upper portion of the substrate so as to expose the first alignment mark from a first surface of the substrate; etching the upper portion of the substrate using the exposed first alignment mark; etching a lower portion of the substrate so as to expose the second alignment mark from a second surface of the substrate; and etching the lower portion of the substrate using the exposed second alignment mark.


Find Patent Forward Citations

Ko, Young-chul. (2008). Double-sided etching method using embedded alignment mark (U.S. Patent No. 7413920). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7413920

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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