The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2008
Filed:
Aug. 16, 2005
Hisashi Ohtsuka, Kanagawa, JP;
Hisashi Ohtsuka, Kanagawa, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An object of the present invention is to provide a method for measuring a rate coefficient by surface plasmon resonance analysis with excellent accuracy, reliability, and cost performance that can improve the assay accuracy and simplify the apparatus. The present invention is provides a method for determining the adsorption rate coefficient (Ka) and the dissociation rate coefficient (Kd) of the reaction between an analyte molecule immobilized on a metal surface and a molecule that interacts with the analyte molecule by measuring changes in surface plasmon resonance signals using a surface plasmon resonance measurement device and performing fitting to a signal curve obtained by such measurement, wherein fitting is performed to the signals from which data obtained at the time of liquid exchange and data obtained at a given time point thereafter have been removed, and that an algorithm is adopted wherein the fitted curve passes through a point representing a baseline value obtained at the time of liquid exchange or immediately therebefore.