The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2008
Filed:
Dec. 05, 2005
Minoru Yasuda, Hachioji, JP;
Minoru Yasuda, Hachioji, JP;
Konica Minolta Holdings, Inc., Tokyo, JP;
Abstract
A method for detecting an interval of recorded positions, including the steps of recording a first pattern group in such a way that the recording heads scan a recording medium so that recording elements record a pattern having repeatedly dark density area and light density area perpendicular to a scanning direction of the recording head, recording a second pattern group in such a way that the recording heads scan the recording medium so that recording elements record a pattern having repeatedly dark density area and light density area perpendicular to a scanning direction of the recording head and further the second pattern group is overlapped on and angled to the first pattern group, detecting interference fringes generated by overlap of the first pattern group and the second pattern group, and detecting a change of the interval of the recorded positions via a positional deviation of the interference fringes.