The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2008

Filed:

Dec. 02, 2005
Applicant:

Anguel S. Brankov, San Jose, CA (US);

Inventor:

Anguel S. Brankov, San Jose, CA (US);

Assignee:

California Micro Devices, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/48 (2006.01); G01N 3/32 (2006.01); G01N 3/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus wherein a material or object to be tested is placed on a base support. A stopper assembly having a stopper tip on one end in contact with the test material or object, and a washer on the opposite end attached to a rod. A projectile is propelled with a selected level of force along the rod and impacts the washer, which transmits the force of impact through the stopper tip to the test material or object. The level of propelling force, the mass of the projectile, the construction of the stopper assembly and the location of impact on the test material or object may be precisely adjusted to simulate real-life impacts.


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