The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2008

Filed:

Nov. 24, 2003
Applicants:

Atsushi Murase, Sagamihara, JP;

Toshiaki Hirata, Kashiwa, JP;

Inventors:

Atsushi Murase, Sagamihara, JP;

Toshiaki Hirata, Kashiwa, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); G06F 11/00 (2006.01); G06F 11/30 (2006.01); G21C 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A control system, computer, method and computer program that imposes a monitoring load to the extent necessary to carry out pattern analysis on the operation of a system and failure analysis and does not apply any excessive monitoring load. The invention includes an interface for receiving an operation performance metric value of each of a plurality of first monitored items from a monitored computer, and a control section for, based on the operation performance metric value of each first monitored item, determining a second monitored item whose data should be obtained and instructing the monitored computer to obtain an operation performance metric value of the second monitored item which is associated with each first monitored item.


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