The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2008
Filed:
Nov. 05, 2002
Geoffrey Deane Owen Nicholls, Palo Alto, CA (US);
Craig R. Powers, San Francisco, CA (US);
Kenneth C. Gardner, Menlo Park, CA (US);
Tana Christine Netsch, Campbell, CA (US);
Tim J. Beauchamp, Belmont, CA (US);
Geoffrey Deane Owen Nicholls, Palo Alto, CA (US);
Craig R. Powers, San Francisco, CA (US);
Kenneth C. Gardner, Menlo Park, CA (US);
Tana Christine Netsch, Campbell, CA (US);
Tim J. Beauchamp, Belmont, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
A method for optimally monitoring a set of data elements for an event. The method includes determining a set of data elements, each of which further comprises a state. An event is commonly a change in this state. The method further includes creating a rule for monitoring the event, wherein the rule comprises an event identification portion resident on a first computer and an action portion resident on a second computer. The method also includes monitoring the set of data elements for the event based, in part, on the event identification portion, and determining if the event has occurred. If so, the method further includes sending the set of data elements to the second computer. The method also includes executing a set of actions, based in part, on the action portion. Thereafter, the method further includes monitoring the set of data elements based, in part, on the rule.