The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2008
Filed:
Apr. 01, 2005
Bennett M. Butters, Lacey, WA (US);
Bennett M. Butters, Lacey, WA (US);
Nativis, Inc., La Jolla, CA (US);
Abstract
Method and apparatus for detecting a selected material in a sample are disclosed. In the method, the sample is placed adjacent a detector coil, for generating an electromagnetic time-domain signal composed of sample source radiation. The signal is first conditioned to convert the signal to an amplified conditioned signal from which frequency components above a selected frequency have been removed, then filtered to selectively pass low-frequency spectral components that are (i) in a frequency range between dc and 50 khz, and (ii) characteristic of the selected material. The filtered signal is cross-correlated with a data set of low-frequency spectral components that are (i) in a frequency range between dc and 50 khz, and (ii) characteristic of a selected material, to produce a frequency-domain spectrum in the frequency range within DC to 50 khz. This spectrum is then used to determine whether the frequency-domain spectrum contains one or more low-frequency signal components that are characteristic of the selected material, and diagnostic of the presence or absence of such material in the sample.