The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2008

Filed:

Apr. 27, 2006
Applicants:

John Christian Fjeldsted, Redwood City, CA (US);

August Jon Hidalgo, San Francisco, CA (US);

William Daniel Frazer, Mountain View, CA (US);

Inventors:

John Christian Fjeldsted, Redwood City, CA (US);

August Jon Hidalgo, San Francisco, CA (US);

William Daniel Frazer, Mountain View, CA (US);

Assignee:

Agilent Technologies, Inc, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A mass spectrometer comprises an ion detector, an analog-to-digital (A/D) converter, a sample adjuster, and an adder. The A/D converter is configured to receive and sample an analog signal from the ion detector thereby providing a plurality of samples. The adder is configured to sum the samples, and the summed samples define a mass spectrum. The sample adjuster is configured to identify a peak defined by the samples and to suppress at least one of the samples of the peak such that a resolution of a peak within the mass spectrum is enhanced.


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