The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2008
Filed:
Mar. 13, 2006
Herbert F. Cattell, Mountain View, CA (US);
Andreas N. Dorsel, Menlo Park, CA (US);
John W. Sadler, Belmont, CA (US);
Nicholas M. Sampas, San Jose, CA (US);
Herbert F. Cattell, Mountain View, CA (US);
Andreas N. Dorsel, Menlo Park, CA (US);
John W. Sadler, Belmont, CA (US);
Nicholas M. Sampas, San Jose, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
Methods for correcting systematic errors in the measured position of deposited features of a nucleic acid array on a substrate. Systematic errors are modeled by an algorithmic model based on measuring the positions (and possibly other properties) of a subset of the features, and a model is constructed for predicting deviations in feature position from an ideal grid. Deviations arising in the deposition process, the scanning process, or both may be corrected.