The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2008

Filed:

Aug. 10, 2004
Applicant:

Anna Jerebko, West Chester, PA (US);

Inventor:

Anna Jerebko, West Chester, PA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of detecting lesions and polyps in a digital image, wherein said image comprises a plurality of 3D volume points, is provided. The method includes identifying a surface in the image, and for each point in the image, calculating a first curvature measure, forming a set of rings of points about each point, each ring being of equal geodesic distance from a center point for the ring, calculating, for each ring, a standard deviation of the first curvature measure, and selecting those rings with a minimum standard deviation for the first curvature measure. A first curvature slope is calculated for the selected rings, those points where the curvature slope departs from the pattern expected for a polyp or lesion are deleted from the surface.


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