The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2008

Filed:

Jul. 09, 2004
Applicant:

Yasuyuki Sugi, Naka-gun, JP;

Inventor:

Yasuyuki Sugi, Naka-gun, JP;

Assignee:

Hitachi Maxell, Ltd., Ibaraki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 13/02 (2006.01); G02B 13/00 (2006.01); G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The multi-wavelength lens for condensing a plurality of kinds of monochromatic light by refraction is disclosed. The lens comprises a common use area for all monochromatic light on at least one lens surface, the area sectioned into a plurality of aspherical zones each of which having a different refractive power; and step portions, each of which formed between adjacent aspherical zones of the plurality of aspherical zones and having a step height Dj (j=1,2,3,4, and so on, in order of closeness to a lens optical axis) in a direction parallel to the lens optical axis. At least half of the step portions satisfy a following formula when a minimum value and a maximum value of Aij for each wavelength λi are MIN(Aij) and MAX(Aij), respectively:MAX()/MIN()<3where, Aij=absolute(Bij−mij),Bij=(absolute(Dj))*(ni−1)/λi−C, ni is a refractive index of a lens for a wavelength λi, mij is an integral number closest to Bij, and C is a corrective term.


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