The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2008
Filed:
Mar. 17, 2006
Yongjian Zhai, Mississauga, CA;
Daniel James Arnold, Milton, CA;
John D. Bell, Toronto, CA;
Tina Malik, Markham, CA;
Yongjian Zhai, Mississauga, CA;
Daniel James Arnold, Milton, CA;
John D. Bell, Toronto, CA;
Tina Malik, Markham, CA;
Arius3D Inc., Mississauga, Ontario, CA;
Abstract
According to an embodiment, a method and system for color calibration in a three-dimensional multi-color laser scanning system is disclosed. An object may be scanned with the scanning system, which scans the object with color laser heads. Laser intensities, corresponding to laser intensity values, may be received from the scanned object. Three different calibration targets are used to setup a field of view (FOV) calibration profile due to scanning position changes, a surface normal calibration profile due to surface normal direction changes, and a color reflectance calibration profile due to color reflectance changes. After compensating for laser power drift fluctuations, the laser intensity values may be further compensated for field of view scanning position changes and surface normal direction changes using the field of view calibration profile and surface normal calibration profile. Color values of each point scanned from the object may be calculated using compensated laser intensity values from the color reflectance profile.