The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7411666 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 12, 2008

Filed:

Dec. 15, 2006
Applicant:

Josef Beller, Tuebingen, DE;

Inventor:

Josef Beller, Tuebingen, DE;

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical time domain reflectometry system is used to determine a power response from a device under test -DUT-. For providing power information data, an optical transmitter launches a probe signal with a first wavelength into a DUT, an optical receiver determines optical power information of a first return signal returning from the DUT at a second wavelength, wherein the second wavelength is not equal to the first wavelength, and an analyzer analyzes the power information determined by the optical receiver, and generating data to be at least one of: visualized, stored, and further processed.


Find Patent Forward Citations

Beller, Josef. (2008). Optical time domain reflectometry system at different wavelengths (U.S. Patent No. 7411666). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7411666

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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