The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2008
Filed:
May. 02, 2005
Applicants:
Yu T. Tian, Palo Alto, CA (US);
Qifan Huang, Sunnyvale, CA (US);
LI Sha, San Jose, CA (US);
Inventors:
Assignee:
Micronas USA, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/393 (2006.01); H04N 7/01 (2006.01);
U.S. Cl.
CPC ...
Abstract
Techniques for performing panoramic scaling are disclosed that reduce visible distortion in a panoramic image. Further, techniques for performing combined YC adjustment and color conversion are disclosed that reduce the size and power requirements of video manipulation hardware by reducing the number of logic gates and memory buffers required when YC adjustment and color conversion are implemented as separate operations.
Tian, Yu. (2008). Method and system for scaling, filtering, scan conversion, panoramic scaling, yc adjustment, and color conversion in a display controller (U.S. Patent No. 7411628). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7411628
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile