The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2008
Filed:
Aug. 31, 2005
James G Stenzel, Rochester, NY (US);
Vincent Berardi, Webster, NY (US);
Cesar R Marquez, Madison, WI (US);
Edward P Imes, Ontario, NY (US);
Ronald M Edsall, Fairport, NY (US);
Warren Brady, Rochester, NY (US);
Liam Cummings, Macedon, NY (US);
Norman Vanas, Rochester, NY (US);
Christopher Delano, Webster, NY (US);
Michael Cook, Waterloo, NY (US);
James G Stenzel, Rochester, NY (US);
Vincent Berardi, Webster, NY (US);
Cesar R Marquez, Madison, WI (US);
Edward P Imes, Ontario, NY (US);
Ronald M Edsall, Fairport, NY (US);
Warren Brady, Rochester, NY (US);
Liam Cummings, Macedon, NY (US);
Norman Vanas, Rochester, NY (US);
Christopher Delano, Webster, NY (US);
Michael Cook, Waterloo, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
Systems, methods, and programs for adjusting marking data for use with alternately stacked multi-thickness media. The systems, methods, and programs input marking data and determine an orientation of sheets of the multi-thickness media that is alternated within a stack. The systems, methods, and programs adjust, for each sheet whose orientation is not consistent with the marking data, the marking data for that sheet such that the marking data for that sheet is consistent with the orientation of that sheet.