The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2008
Filed:
Sep. 14, 2005
Michael E. Hamerly, Vadnais Heights, MN (US);
Barry W. Kostyk, Stillwater, MN (US);
Robert D. Lorentz, North Oaks, MN (US);
Robert A. Sainati, Bloomington, MN (US);
James P. Mcgee, Cedar, MN (US);
Subhalakshmi M. Ananthanarayanan, Woodbury, MN (US);
John W. Van Bogart, Minneapolis, MN (US);
Ronald D. Jesme, Plymouth, MN (US);
Michael E. Hamerly, Vadnais Heights, MN (US);
Barry W. Kostyk, Stillwater, MN (US);
Robert D. Lorentz, North Oaks, MN (US);
Robert A. Sainati, Bloomington, MN (US);
James P. McGee, Cedar, MN (US);
Subhalakshmi M. Ananthanarayanan, Woodbury, MN (US);
John W. Van Bogart, Minneapolis, MN (US);
Ronald D. Jesme, Plymouth, MN (US);
3M Innovative Properties Company, St. Paul, MN (US);
Abstract
Methods of monitoring items and/or materials from a manufacturing process. One embodiment of the invention provides a method of monitoring items and/or materials from a manufacturing process using a plurality of RFID tagged containers, and a plurality of stations associated with different portions of the manufacturing process, where each station includes an RFID reader.