The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2008

Filed:

Aug. 28, 2006
Applicants:

Ronald C. Alford, Austin, TX (US);

Gary A. Kurtzman, Austin, TX (US);

Shobak R. Kythakyapuzha, Round Rock, TX (US);

Inventors:

Ronald C. Alford, Austin, TX (US);

Gary A. Kurtzman, Austin, TX (US);

Shobak R. Kythakyapuzha, Round Rock, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03B 5/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

An overtone crystal oscillator automatic calibration system including an overtone crystal oscillator with multiple programmable resistors and multiple amplifiers with supply voltage inputs and a calibration system. The calibration system adjusts the programmable resistors and the supply voltage inputs and detects oscillation of the overtone crystal oscillator. The calibration system adjusts the programmable resistors and the supply voltage input for each of multiple sequential steps to adjust the frequency bandwidth, such as from a higher bandwidth and lower gain to a lower bandwidth at higher gain. For example, each resistance level is tested for each of multiple supply voltage levels. The range of resistances and voltages is designed to ensure oscillation at a selected overtone frequency while avoiding oscillation at a fundamental frequency of the oscillator crystal. Oscillation may be detected by a counter which counts to a predetermined count value indicating successful oscillation.


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