The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2008

Filed:

May. 25, 2006
Applicants:

Andres Richter, Pforzheim, DE;

Stefan Grohmann, Bretzfeld, DE;

Jörg Lummerzheim, Lautertal, DE;

Inventors:

Andres Richter, Pforzheim, DE;

Stefan Grohmann, Bretzfeld, DE;

Jörg Lummerzheim, Lautertal, DE;

Assignee:

ME-IN GmbH, Karlsruhe, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/44 (2006.01); H01J 40/14 (2006.01); H03F 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a circuit arrangement for analyzing a clocked signal reflected from an object, particularly an optical signal, wherein at least one radiation emitter which, for providing the clocked signal, is connected to a clocking signal generator, and at least one radiation receiver which receives radiation pulses emitted by the radiation emitter and reflected from the object, and a comparator by which the output signal pulses of the radiation are compared with reference pulses whose amplitudes depend on output signals of the comparator, are provided, the reference signal pulses occur concurrently with the radiation impulses received by the radiation receiver and the impulses received by the radiation receiver are compensated for each by a respective internal reference impulse before their analysis in the circuit arrangement.


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