The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2008
Filed:
Oct. 17, 2005
George W. Wood, Austin, TX (US);
Amol V. Bhinge, Austin, TX (US);
George W. Wood, Austin, TX (US);
Amol V. Bhinge, Austin, TX (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A method, computer program product, and data processing system for minimizing the number of test sequences needed to achieve a desired level of coverage of events in testing a semiconductor design is disclosed. Test patterns are randomly generated by one or more 'frontend' computers. Results from applying these patterns to the design under test are transmitted to a 'backend' computer for processing. A determination is made as to which test sequences trigger events not already triggered by previously-considered test sequences. An autograde data structure is generated which further reduces the number of test sequences. A preferred embodiment of the present invention may be used to reduce the number of test sequences required, but may also be used to provide test engineers a basis for devising manually-created test sequences to test related events.