The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2008
Filed:
Oct. 06, 2004
Gabriel Romero, Colorado Springs, CO (US);
Coralyn Gauvin, Colorado Springs, CO (US);
Gabriel Romero, Colorado Springs, CO (US);
Coralyn Gauvin, Colorado Springs, CO (US);
LSI Corporation, Milpitas, CA (US);
Abstract
A system and method for testing a device with multiple interfaces by generating a predetermined data pattern within the device, transmitting the pattern to a test analyzer, generating a second predetermined data pattern within the test analyzer, and simultaneously transmitting the second test pattern to the device where the second test pattern is verified. The first and second test patterns may be the same or different, depending on the application. Further, the transmit and receive paths may be tested separately and independently in addition to simultaneously.