Simultaneous ac logic self-test of multiple clock domains

Abstract

A technique is provided for simultaneous and/or selective self-testing of internal logic and asynchronous boundaries of an IC having a plurality of clock domains. A clock command is generated by an on product clock generator for each clock domain simultaneously; and an asynchronous receive clock driver provides a programmable delay to a capture clock based on predetermined cycle requirements of the asynchronous boundaries. Asynchronous boundary test requirements are defined exclusively from the perspective of the asynchronous boundary receiver latches, thereby reducing dependencies among clock domains. Advantageously, the design of internal logic and asynchronous boundaries of each clock domain, ultimately residing within an IC, can proceed without a priori knowledge of how the clock domain will eventually be used in aggregation with other clock domains.