The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2008
Filed:
Jan. 28, 2004
Leon Maria Albertus Van DE Logt, Eindhoven, NL;
Thomas Franciscus Waayers, Eindhoven, NL;
Frank Van Der Heyden, Eindhoven, NL;
Leon Maria Albertus Van De Logt, Eindhoven, NL;
Thomas Franciscus Waayers, Eindhoven, NL;
Frank Van Der Heyden, Eindhoven, NL;
NXP B.V., Eindhoven, NL;
Abstract
An integrated circuit with a test interface contains a boundary scan chain with cells () coupled between a test data input (TDI) and output (TDO) in a shift register structure. Each cell () is also coupled between a respective one of the terminals () and the core circuit (). A test control circuit (TAP_C) supports an instruction to switch the boundary scan chain to a mode in which mode selectable first ones of the cells () transport data serially along the boundary scan chain while selectable second ones of the cells () write or read data that has been or will be transported through the first ones of the cells () in the further mode to or from the terminals () from or to the scan chain.