The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2008

Filed:

Dec. 19, 2003
Applicants:

Brendan Murphy, Cambshire, GB;

Archana Ganapathi, Palo Alto, CA (US);

Inventors:

Brendan Murphy, Cambshire, GB;

Archana Ganapathi, Palo Alto, CA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for determining related node failures in a multi-node system use log data obtained from the nodes. This log data is processed in various ways to indicate clusters of nodes that experience related failures.


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Murphy, Brendan. (2008). Determination of related failure events in a multi-node system (U.S. Patent No. 7409604). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7409604

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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