The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2008
Filed:
Jan. 18, 2002
Qingmao HU, Singapore, SG;
Wieslaw Lucjan Nowinski, Singapore, SG;
Qingmao Hu, Singapore, SG;
Wieslaw Lucjan Nowinski, Singapore, SG;
Kent Ridge Digital Labs, Singapore, SG;
Abstract
A method of determining symmetry in an image, a method of determining a symmetry plane line segment of a 3D image, a method of determining a symmetry line of a 2D image, and a computer program product. The method includes a) determining at least one searching line segment within a predefined search area of an image portion, the at least one searching line segment including a reference point (x, y) at its center and an angle θ with respect to a predetermined axis of the image portion; b) for each searching line segment, determining a first local characteristic in accordance with a measurement at points adjacent the searching line segment; c) determining the symmetry in the image in accordance with a calculation based on the first local characteristic.