The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2008
Filed:
May. 23, 2006
Bruce Matthew Dunham, Mequon, WI (US);
Jonathan Richard Schmidt, Wales, WI (US);
Sergio Lemaitre, Whitefish Bay, WI (US);
Bruce Matthew Dunham, Mequon, WI (US);
Jonathan Richard Schmidt, Wales, WI (US);
Sergio Lemaitre, Whitefish Bay, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for controlling focal spot size changes of an x-ray source in an imaging system includes measuring focal spot sizes as a function of a plurality of x-ray source operating parameters, determining a calibration table or transfer function utilizing the measured focal spot sizes as a function of the plurality of x-ray tube operating parameters, and utilizing the calibration table or transfer function to control focal spot size variations during operation of the imaging system.