The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2008

Filed:

Aug. 12, 2004
Applicants:

Andrew J. Banchieri, Newark, CA (US);

David E. Kresse, Walnut Creek, CA (US);

Inventors:

Andrew J. Banchieri, Newark, CA (US);

David E. Kresse, Walnut Creek, CA (US);

Assignee:

GE Homeland Protection, Inc., Newark, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A nonintrusive inspection apparatus is described of the kind having a base frame, an elongated shield on the base frame, a conveyor belt passing through the shield which is used for transporting closed containers, and a rotating CT scanner subsystem which is used for scanning the container on the conveyor belt. The CT scanner subsystem is mounted through the shield to the base frame. The shield provides sufficient rigidity for the CT scanner subsystem. A cover is positioned over the CT scanner subsystem, but only over a portion of the shield, thereby allowing for a person on one side of the shield to see a person on an opposite side of the shield.


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