The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2008
Filed:
Nov. 07, 2006
Applicants:
Lei Zhu, Stanford, CA (US);
Rebecca Fahrig, Palo Alto, CA (US);
Inventors:
Lei Zhu, Stanford, CA (US);
Rebecca Fahrig, Palo Alto, CA (US);
Assignee:
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Disclosed is x-ray cone beam scan data reconstruction of an imaged object with a reconstruction algorithm using shift invariant filtering and backprojection with the maximum tomographic capability of a circular scan larger than p plus cone angle, when CB data is not truncated and data extrapolation is not allowed. The reconstruction scheme includes a conventional FDK reconstruction and a parallel reconstruction using differential back projection and 1D Hilbert transform to suppress the CB artifacts.