The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2008

Filed:

Aug. 15, 2003
Applicants:

Bong-joon Lee, Seoul, KR;

Moon-sang Hwang, Yong-In-Si, KR;

Sang-hyun Lee, Cupertino, CA (US);

Deog-kyoon Jeong, Seoul, KR;

Inventors:

Bong-Joon Lee, Seoul, KR;

Moon-Sang Hwang, Yong-In-Si, KR;

Sang-Hyun Lee, Cupertino, CA (US);

Deog-Kyoon Jeong, Seoul, KR;

Assignee:

Silicon Image, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03D 3/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for 2× oversampling of data having jitter. In some embodiments, the invention is a clock and data recovery device including an alternating edge sampling binary phase detector, and which is configured to stabilize loop characteristics in various jitter environments and can be implemented with small hardware overhead. A transceiver that embodies the invention can be implemented as a CMOS integrated circuit using a 0.18 μm CMOS process, with the transceiver chip being capable of recovering data having a data rate of up to 11.5 Gbps from a signal received over a serial link, while consuming no more than 540 mW from 1.8V supply, and with a bit error rate of less than 10.


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