The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2008

Filed:

Aug. 31, 2005
Applicants:

Klaus Pirkl, Büttelborn, DE;

Manfred Haberer, Riegel, DE;

Gerhard Mutter, Ibach, DE;

Inventors:

Klaus Pirkl, Büttelborn, DE;

Manfred Haberer, Riegel, DE;

Gerhard Mutter, Ibach, DE;

Assignee:

Sick AG, Waldkirch/Breisgau, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 13/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method for the control of a monitored zone, in particular at transport devices for objects, wherein the monitored zone is scanned by means of at least one spatially resolving sensor, in particular a laser scanner and/or a camera system, the positions of object points in the monitored zone are determined and a contour search is carried out in at least a sub-set of the determined positions in that these positions are mathematically examined as to whether the respective object points lie on at least one model line pre-determined with respect to shape and/or length within a pre-determinable tolerance, said model line corresponding to at least a part of a contour of a permitted object in the monitored zone, with the contour search being carried out independently of the location of the positions relative to the sensor.


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