The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2008

Filed:

May. 16, 2006
Applicants:

Marwan M. Hassoun, Davis, CA (US);

Moises E. Robinson, Austin, TX (US);

David E. Tetzlaff, Minneapolis, MN (US);

Inventors:

Marwan M. Hassoun, Davis, CA (US);

Moises E. Robinson, Austin, TX (US);

David E. Tetzlaff, Minneapolis, MN (US);

Assignee:

XILINX, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 19/003 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus to provide various mechanisms to improve yield of an integrated circuit (IC) employing serial input/output (I/O) communication devices. A single error correction model provides one spare transceiver per group of primary transceivers, whereby reconfiguration of the IC isolates the defective transceiver and configures the replacement transceiver for operation in its place. A multiple error correction model is also provided, whereby multiple replacement transceivers may be configured to replace multiple defective transceivers. The replacement mechanism may occur during various phases of the IC, such as during wafer testing, final testing, or post-deployment testing.


Find Patent Forward Citations

Loading…