The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2008
Filed:
Apr. 20, 2007
Richard Aufrichtig, Palo Alto, CA (US);
John R Lamberty, Oconomowoc, WI (US);
Paul R. Granfors, Sunnyvale, CA (US);
Richard Cronce, New Berlin, WI (US);
Richard Aufrichtig, Palo Alto, CA (US);
John R Lamberty, Oconomowoc, WI (US);
Paul R. Granfors, Sunnyvale, CA (US);
Richard Cronce, New Berlin, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
Systems, methods and apparatus are provided through which in some embodiments the line time of an X-Ray detector is dynamically selected so as to nullify an aliased interference signal. The frequency of a noise signal generated by a source external to the digital X-ray detector is determined and, based on the determined frequency, the line time of the digital X-ray is adjusted so as to compensate for the interfering noise. The frequency of the noise can be directly determined from an electromagnetic interference (EMI) sensor or derived through analysis of the power spectrum of the noise signal.