The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2008
Filed:
Sep. 29, 2005
Sharon Xiaorong Wang, Hoffman Estates, IL (US);
Sharon Xiaorong Wang, Hoffman Estates, IL (US);
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Abstract
A method for reducing the scanning time of SPECT broadly includes determining a physical characteristic of an object within a radiation field, calculating an optimal starting angle of at least two detectors based on the physical characteristic of the object and a trajectory of the at least two detectors such that the geometric efficiency of the detectors along the trajectory can be maximized, angularly displacing the detectors based on the calculated optimal starting angle, scanning the object within the field to detect one or more gamma photons emanating from the object, and preparing an image from the one or more detected gamma photons. Preferably, the physical characteristic of the object is its location within the field, but can include properties such as signal to noise ratio, shape of the object, etc.