The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2008
Filed:
Jul. 22, 2004
Christopher J. Clark, Durham, NH (US);
Michael Ricchetti, Nashua, NH (US);
Christopher J. Clark, Durham, NH (US);
Michael Ricchetti, Nashua, NH (US);
Intellitech Corporation, Durham, NH (US);
Abstract
A system and method for maximizing the throughput of test and configuration in the manufacture of electronic circuits and systems. The system employs a tester having a flexible parallel test architecture with expandable resources that can accommodate a selected number of units under test (UUTs). The parallel test architecture is configurable to accept separate banks or partitions of UUTs, thereby enabling the system to obtain an optimal or maximum achievable throughput of test and configuration for the UUTs. The system determines an optimal or maximum achievable throughput by calculating a desired number N of UUTs to be tested/configured in parallel. Testing or configuring this desired number of UUTs in parallel allows the handling time to be balanced with the test and configuration times, thereby resulting in the maximum achievable throughput.