The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2008

Filed:

Jun. 07, 2004
Applicant:

Ludovic Malfait, Ipswich, GB;

Inventor:

Ludovic Malfait, Ipswich, GB;

Assignee:

Psytechnics Limited, Ipswich, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G10L 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention relates to a new parameter suitable for use in non-intrusive speech quality assessment system. The invention provides a method of generating a parameter from a signal comprising a sequence of values measured from voiced portions of said signal at a sampling frequency, said parameter suitable for use in a quality assessment tool. The method includes steps of selecting portions of frequency transformed sections of the signal in dependence upon a pitch estimate; generating an average value for each portion; and generating a section parameter depending upon the difference between the averages of successive portions. Said section parameter is averaged over a number of iterations of the method to generate the new parameter of the invention.


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