The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2008
Filed:
May. 12, 2004
Robert Lindeman, Centennial, CO (US);
Robert Lindeman, Centennial, CO (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
Systems and methods are provided for filtering detected events to determine events of interest. A sensor data analysis system identifies a plurality of detected events from provided sensor data and evaluates the sensor data to determine at least one characteristic associated with each event. The sensor data analysis system reports the plurality of detected events and their associated characteristics. At least one affiliated event generator is operative to generate at least one affiliated event and produce at least one event report. A given event report provides at least one characteristic associated with an affiliated event. An event filtering system compares the at least one event report to the detected events to identify at least one affiliated event amongst the plurality of detected events.