The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2008
Filed:
Aug. 07, 2006
Andreas Hecker, Asslar, DE;
Andreas Hecker, Asslar, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
The invention relates to a microscope for conventional fluorescence microscopy (Epi fluorescence) and for total internal reflection microscopy, including at least one light source () for the conventional fluorescence illumination and at least one light source () for the evanescent illumination, and including an objective (), wherein the illuminating light coming from the light sources () on different illumination paths () enters the objective () via a beam combiner () and from there is passed to the sample (), characterized in that the exit pupil of the objective () is imaged on the beam combiner () and the beam combiner is structured such that it guides the illuminating light used for the conventional fluorescence illumination and the illuminating light used for the evanescent illumination into the objective () along beam paths () which are geometrically separate from one another, and preferably run parallel or coaxially to one another.