The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2008

Filed:

Dec. 19, 2003
Applicants:

Frank Jeroen Pieter Schuurmans, Eindhoven, NL;

Michael Cornelis Van Beek, Eindhoven, NL;

Levinus Pieter Bakker, Eindhoven, NL;

Wouter Harry Jacinth Rensen, Eindhoven, NL;

Bernardus Hendrikus Wilhelmus Hendriks, Eindhoven, NL;

Robert Frans Maria Hendriks, Eindhoven, NL;

Thomas Steffen, Eindhoven, NL;

Inventors:
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/32 (2006.01); G01J 3/457 (2006.01); G02B 26/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The optical analysis system () for determining an amplitude of a principal component of an optical signal comprises a multivariate optical element () for reflecting the optical signal and thereby weighing the optical signal by a spectral weighing function, and a detector (P,N) for detecting the weighed optical signal. The optical analysis system () may further comprise a dispersive element () for spectrally dispersing the optical signal, the multivariate optical element being arranged to receive the dispersed optical signal. The blood analysis system () comprises the optical analysis system () according to the invention.


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