The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2008
Filed:
Oct. 05, 2005
Bang-hao Wu, Kao Hsiung, TW;
Ching-wen Hsiao, Pan Chiao, TW;
Yu-ming Chen, Hsin Chu, TW;
Hsin-chun Chiang, Hsin Chu, TW;
Chung-wen Wu, Hsin Chu Hsien, TW;
Bang-Hao Wu, Kao Hsiung, TW;
Ching-Wen Hsiao, Pan Chiao, TW;
Yu-Ming Chen, Hsin Chu, TW;
Hsin-Chun Chiang, Hsin Chu, TW;
Chung-Wen Wu, Hsin Chu Hsien, TW;
Taiwan TFT LCD Association, Hsinchu, TW;
Chunghwa Picture Tubes, Ltd., Taoyuan, TW;
Au Optronics Corp., Hsinchu, TW;
Quanta Display Inc., Tao Yuan Shien, TW;
Hannstar Display Corp., Tainan County, TW;
Chi Mei Optoelectronics Corp., Tainan County, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Toppoly Optoelectronics Corp., Miao-Li County, TW;
Abstract
A method that uses at least one hydrogen ion beam for alignment of liquid crystal molecules is proposed in the present invention. The method of the present invention is proposed to resolve the problems of physical destruction and surface deterioration of the alignment films caused by the conventional method using argon ions beams. The method of the present invention directly uses at least one hydrogen ion beam to impact the alignment film. Hence, the physical destruction of the alignment film is reduced. In addition, via the reaction between hydrogen ions and the alignment films, the quality of the alignment film is improved.