The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2008
Filed:
May. 26, 2004
William C. Moyer, Dripping Springs, TX (US);
Michael D. Fitzsimmons, Austin, TX (US);
William C. Moyer, Dripping Springs, TX (US);
Michael D. Fitzsimmons, Austin, TX (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A method for providing endianness control in a data processing system includes initiating an access which accesses a peripheral, providing a first endianness control that corresponds to the peripheral, and completing the access using the endianness control to affect the endianness order of the information transferred during the access. In one embodiment, the first endianness control overrides a default endianness corresponding to the access. The default endianness may be provided by a master endianness control corresponding to a master requesting the current access. A data processing system includes a first bus master, first and second peripherals, first endianness control corresponding to the first peripheral and second endianness control corresponding to the second peripheral, and control circuitry which uses the first endianness control to control endianness for an access between the first bus master and the first peripheral. In one embodiment, the data processing system may include multiple masters.