The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2008

Filed:

Feb. 01, 2006
Applicant:

Dingguo Chen, Eden Prairie, MN (US);

Inventor:

Dingguo Chen, Eden Prairie, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06E 1/00 (2006.01); G06E 3/00 (2006.01); G06F 15/18 (2006.01); G06G 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system, method, and device for identifying data sources for a neural network are disclosed. The exemplary system may have a module for determining load curves for each selected data set. The system may also have a module for determining a global difference measure and a global similarity measure for each load curve of each selected data set. The system may have a module for determining a set of data sets with lowest value global difference measure. The system may also have a module for determining a set of data sets with largest value global similarity measure. The system may also have a module for determining a union of the sets of lowest value difference measure and the sets of largest value similarity measure. The system may also have a module for determining for each set in the union one of a local similarity measure and a local difference measure and a module for selecting a set of reduced data sets based on one of the local similarity measure and the local difference measure.


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