The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2008

Filed:

Nov. 06, 2003
Applicants:

Dominique Marc Placko, Creteil, FR;

Nicolas Liebeaux, Cachan, FR;

Tribikram Kundu, Tucson, AZ (US);

Inventors:

Dominique Marc Placko, Creteil, FR;

Nicolas Liebeaux, Cachan, FR;

Tribikram Kundu, Tucson, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/60 (2006.01); G09B 25/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to the modelling of the interactions between an incident wave and an obstacle, in particular in the area of nondestructive testing. According to the invention, the surface of the obstacle is meshed and at least one source (S) is allocated to each surface element (dS). Boundary conditions are then calculated at each mesh cell of the obstacle and source values are deduced therefrom. On the basis of an interaction matrix and of these source values, a physical quantity representative of the interaction between the wave and the obstacle is estimated at any point of space.


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