The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2008
Filed:
Nov. 30, 2005
Thomas Budmiger, Ettingen, CH;
Saso Jezernik, Zurich, CH;
Thomas Budmiger, Ettingen, CH;
Saso Jezernik, Zurich, CH;
Endress + Hauser Flowtec AG, Reinach, CH;
Abstract
The process measuring device comprises a flow sensor having a measuring tube, a sensor arrangement for producing a measurement signal, and an evaluation and operating circuit. The method serves to compensate for the effects of interfering potentials which are caused especially by foreign particles or air bubbles in the liquid to be measured. For this purpose, an anomaly in the waveform of the measurement signal caused at least in part by an electrical, especially pulse-shaped, interfering potential is detected by determining within a stored first data set a data group which digitally represents the anomaly. To generate an interference-free data set, the data belonging to the data group are removed from the stored first data set.