The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2008

Filed:

Aug. 02, 2005
Applicants:

Francis Dominique, Rockaway, NJ (US);

Hongwel Kong, Denville, NJ (US);

Walld E. Nabhane, Bedminster, NJ (US);

Inventors:

Francis Dominique, Rockaway, NJ (US);

Hongwel Kong, Denville, NJ (US);

Walld E. Nabhane, Bedminster, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment of the method, a channel quality metric for a first subframe is estimated based at least in part on a channel quality metric for a previous subframe, and a channel quality metric for a second subframe is estimated based at least in part on the channel quality metric for the previous subframe. Here, the second subframe is later in time than the first subframe. Then, a channel quality metric for a time slot located between the first and second subframes is estimated based on the channel quality metrics for the first and second subframes.


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