The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2008

Filed:

Aug. 10, 2006
Applicants:

Yuji Nagai, Kawasaki, JP;

Yutaka Kashihara, Chigasaki, JP;

Akihiro Ogawa, Yokohama, JP;

Inventors:

Yuji Nagai, Kawasaki, JP;

Yutaka Kashihara, Chigasaki, JP;

Akihiro Ogawa, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 20/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An evaluation method for calculating an identification signal by using PRML, comprises a table storing true patterns and ideal signals thereof, false patterns corresponding to the true patterns and ideal signals thereof, and Euclidean distance between the true pattern and the false pattern, a calculating unit, when a recording signal synchronized with an identification signal coincides with any pattern of the table, calculates a distance between Euclidean distance between the ideal signal of the true pattern and a reproduction signal and Euclidean distance between the ideal signal of the false pattern and a reproduction signal, and an evaluation unit which evaluates an identification signal by using an average and standard deviation of difference. A table for patterns is created for a likely mistaken pattern, whereby calculating an evaluation value with high precision, of a signal quality, with a small amount of calculation.


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